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                                       Details for article 32 of 113 found articles
 
 
  Determination of surface state density from gm-Vg characteristics of MOSFETs
 
 
Title: Determination of surface state density from gm-Vg characteristics of MOSFETs
Author:
Appeared in: Microelectronics reliability
Paging: Volume 17 (1978) nr. 6 pages 1 p.
Year: 1978
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 32 of 113 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands