Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 28 of 96 found articles
 
 
  Effects of bulk trapping on the memory characteristics of thick-oxide MNOS variable-threshold capacitors
 
 
Title: Effects of bulk trapping on the memory characteristics of thick-oxide MNOS variable-threshold capacitors
Author:
Appeared in: Microelectronics reliability
Paging: Volume 13 (1974) nr. 2 pages 2 p.
Year: 1974
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 28 of 96 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands