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Journal description
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Details for article 44 of 125 found articles
| Title: |
Ellipsometry as applied to the measurement of the thicknesses and indices of oxide films on silicon |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 11 (1972) nr. 3 pages 1 p. |
| Year: |
1972 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 44 of 125 found articles
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