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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 10 of 12 found articles
| Title: |
Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory |
| Author: |
Chandrashekhar, Sandhya Puchner, Helmut Mitani, Jun Shinozaki, Satoshi Sardi, Mohamed Hoffman, David |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 108 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 12 found articles
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