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Journal description
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Details for article 102 of 103 found articles
| Title: |
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation |
| Author: |
Lamhamdi, M. Pons, P. Zaghloul, U. Boudou, L. Coccetti, F. Guastavino, J. Segui, Y. Papaioannou, G. Plana, R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 48 (2008) nr. 8-9 pages 5 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 102 of 103 found articles
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