|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 3 of 12 found articles
| Title: |
Availability analysis of a two dissimilar-unit deteriorating standby system with inspection |
| Author: |
Mokaddis, G.S. Labib, S.W. El-Said, Kh.M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 33 (1993) nr. 14 pages 23 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 12 found articles
| << previous | next >> |