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                                       Details for article 10 of 21 found articles
 
 
  Fine structure of heat flow path in semiconductor devices: A measurement and identification method
 
 
Title: Fine structure of heat flow path in semiconductor devices: A measurement and identification method
Author: Székely, Vladimir
Van Bien, Tran
Appeared in: Solid-state electronics
Paging: Volume 31 (1988) nr. 9 pages 6 p.
Year: 1988
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 21 found articles
 
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