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Details for article 184 of 186 found articles
| Title: |
X-ray diffraction analysis fo GaAs/AlAs multilayer structures grown by molecular beam epitaxy on (311) and (210) GaAs surfaces |
| Author: |
Tagliente, M.A. De Caro, L. Tapfer, L. Nötzel, R. Fischer, A. Ploog, K. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 37 (1994) nr. 4-6 pages 5 p. |
| Year: |
1994 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 184 of 186 found articles
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