|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 56 found articles
| Title: |
An atomic force microscopy study of a temperature dependent morphology transition of GaN grown on sapphire by MOCVD |
| Author: |
de Theije, F.K. Zauner, A.R.A. Hageman, P.R. van Enckevort, W.J.P. Larsen, P.K. |
| Appeared in: |
Journal of crystal growth |
| Paging: | Volume 197 (1999) nr. 1-2 pages 11 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 56 found articles
| next >> |