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                                       Details for article 928 of 9875 found articles
 
 
  Application of in situ UV-vis spectroscopy and an in situ dc resistance measurement technique to the study of a poly(thiophene-3-methanol) film
 
 
Title: Application of in situ UV-vis spectroscopy and an in situ dc resistance measurement technique to the study of a poly(thiophene-3-methanol) film
Author: Lankinen, Eeva
Pohjakallio, Maija
Sundholm, Göran
Talonen, Panu
Laitinen, Timo
Saario, Timo
Appeared in: Journal of electroanalytical chemistry
Paging: Volume 437 (1997) nr. 1-2 pages 8 p.
Year: 1997
Contents:
Publisher: Elsevier Science S.A. All rights reserved
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 928 of 9875 found articles
 
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