|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 24 of 83 found articles
| Title: |
FT-IR Spectroscopy combined with hadamard transform technique to the plane-resolving analysis of flat samples |
| Author: |
Kraenz, Martin E. Kunath, Dietmar |
| Appeared in: |
Journal of molecular structure |
| Paging: | Volume 79 (1982) nr. C pages 4 p. |
| Year: |
1982 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 83 found articles
| << previous | next >> |