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Multilayer graphene, Moiré patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC |
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Titel: |
Multilayer graphene, Moiré patterns, grain boundaries and defects identified by scanning tunneling microscopy on the m-plane, non-polar surface of SiC |
Auteur: |
Xu, P. Qi, D. Schoelz, J.K. Thompson, J. Thibado, P.M. Wheeler, V.D. Nyakiti, L.O. Myers-Ward, R.L. Eddy Jr., C.R. Gaskill, D.K. Neek-Amal, M. Peeters, F.M. |
Verschenen in: |
Carbon |
Paginering: |
Jaargang 80 (2014) nr. C pagina's 7 p. |
Jaar: |
2014 |
Inhoud: |
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Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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