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                                       Details for article 35 of 541 found articles
 
 
  Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
 
 
Title: Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy
Author: Nemes-Incze, P.
Osváth, Z.
Kamarás, K.
Biró, L.P.
Appeared in: Carbon
Paging: Volume 46 (2008) nr. 11 pages 8 p.
Year: 2008
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 35 of 541 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands